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Theories concerning the relationship between an assemblage of particles and the pattern of light it scattered were proposed in the 1800’s, mathematically unified by Mie in 1908, and eloquently summarized by van de Hulst in 1957. By the early 1970’s, laser light scattering particle sizing instruments were becoming commercially available. A major problem with this technique, even up until today, has been the lack of agreement between analyses of the same sample material by instruments from different manufacturers, and even between different models produced by the same manufacturer.
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This is primarily because of measurement of too few data points in the scattering pattern and the inadequate attempts to compensate for low resolution and other shortcomings using software-based algorithms.
Micromeritics has taken a new and more effective design approach to measuring the scattering pattern. Rather than use a photodiode array to capture average light intensity readings over extended regions of the scattering pattern, the Saturn DigiSizer II uses a high-resolution CCD array in a stepwise manner to capture a true digital representation of the scattering pattern – not simply the 50- or 100-light measurements within the pattern as taken with non-digital techniques.
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With this high-resolution, closely spaced array of data, the intensity versus angle plot of data is practically continuous. Thus, Mie theory can be applied directly, without compensation algorithms and without concern over whether the distribution is monomodal or multimodal. The quality of the Saturn DigiSizer II analysis is apparent upon overlaying the angle verses intensity plot of experimental data from an analysis of a reference material (or a mixture of different size reference materials) with the angle versus intensity plot of data calculated from Mie theory for the reference size(s). Such a comparison is a standard report provided by the Saturn DigiSizer II.
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