New Surface Area Reference Materials to Support Exemplary Quality Assurance in Routine Measurements
Particularly Relevant for Analysis in Highly-regulated Environments Tony Thornton, Micromeritics Director of Technical Information Micromeritics Instrument Corp. has introduced a new range of secondary standards which makes it easier to demonstrate the highest levels of data integrity when characterizing surface area by gas adsorption. Traceable to either NIST (National Institute of Standards and Technology) or BAM (Bundesanstalt für Materialforschung…